Title :
Color permutation: an iterative algorithm for memory packing
Author :
Jianwen Zhu ; Rogers, E.S., Sr.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
It is predicted that 70% of silicon real-estate will be occupied by memories in future system-on-chips. The minimization of on-chip memory hence becomes increasingly important for cost, performance and energy consumption. In this paper, we present a reasonably fast algorithm based on iterative improvement, which packs a large number of memory blocks into a minimum-size address space. The efficiency of the algorithm is achieved by two new techniques. First, in order to evaluate each solution in linear time, we propose a new algorithm based on the acyclic orientation of the memory conflict graph. Second, we propose a novel representation of the solution which effectively compresses the potentially infinite solution space to a finite value of n!, where n is the number of vertices in the memory conflict graph. Furthermore, if a near-optimal solution is satisfactory, this value can be dramatically reduced to /spl chi/!, where /spl chi/! is the chromatic number of the memory conflict graph. Experiments show that consistent improvement over scalar method by 30% can be achieved.
Keywords :
application specific integrated circuits; circuit layout CAD; graph colouring; integrated circuit layout; iterative methods; low-power electronics; semiconductor storage; storage allocation; CAD; acyclic orientation; chromatic number; color permutation; energy consumption; iterative algorithm; linear time; memory allocation; memory blocks; memory conflict graph; memory packing; minimum-size address space; near-optimal solution; on-chip memory; silicon real-estate; system-on-chips; Costs; Energy consumption; Heuristic algorithms; Iterative algorithms; Logic; Minimization methods; Random access memory; Silicon; Strontium; System-on-a-chip;
Conference_Titel :
Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7247-6
DOI :
10.1109/ICCAD.2001.968651