Title :
Influence of Microgeometry and Microstructure of Current Carrying Layer on Heat Losses in Waveguides and Waveguide Elements
Author :
Dmitrachenko, V.M. ; Polukarov, Y.M. ; Gamburg, Y.D. ; Ekimenko, T.M.
Author_Institution :
Ministry of Postal and Electrical Communications, U.S.S.R.
Keywords :
Electromagnetic heating; Electron microscopy; Electron optics; Lattices; Microstructure; Optical losses; Optical microscopy; Optical surface waves; Optical waveguides; Surface treatment;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331903
