• DocumentCode
    1959956
  • Title

    Development of a digital 35MHz, 64-channel phased ultrasound array imaging system for NDT applications

  • Author

    Hu, ChangHong ; Zheng, Fan ; Sun, Ping ; Zhang, Lequan ; Jiang, Xiaoning ; Snook, Kevin ; Wesley, S. ; Hackenberger ; Liu, Ruibin ; Geng, Xuecang ; Shung, K. Kirk

  • Author_Institution
    Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    1829
  • Lastpage
    1832
  • Abstract
    A system is composed of 64 channels of analog front-end pulser/receiver, 64 channels of Time-Gain Compensation (TGC), 64 channels of high-speed digitizer, and DSP-based beamformer implementation. The data are transferred to a PC via an Ethernet card. The system provides 64 channels of excitation pulsers while receiving simultaneously at a 120-200 MHz sampling rate at 12-bit resolution. The digitized data of all channels are first fed through FPGAs, and then stored in memories. Those raw data are then accessed by a DSP where the beamformer is implemented. The open architecture of the system design has the capability of carrying out synthetic aperture algorithms with the combination of single/multiple elements in transmit and single/multiple elements in reception.
  • Keywords
    acoustic pulses; acoustic receivers; analogue-digital conversion; array signal processing; field programmable gate arrays; local area networks; ultrasonic arrays; ultrasonic imaging; ultrasonic materials testing; ultrasonic transducer arrays; DSP-based beamformer; Ethernet card; FPGA; NDT; SiC; analog front-end pulser; analog receiver; digital 64-channel phased ultrasound array imaging system; digitized data; excitation pulsers; frequency 35 MHz; high-speed digitizer; synthetic aperture algorithm; time-gain compensation; word length 12 bit; Arrays; Clocks; Delay; Digital signal processing; Field programmable gate arrays; Silicon carbide; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-0382-9
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2010.5935821
  • Filename
    5935821