• DocumentCode
    1959966
  • Title

    Radiation Damage Testing Of Transistors For SSC Front-end Electronics

  • Author

    Dawson, J. ; Ekenberg, T. ; Stevens, A. ; Kraner, H. ; Radeka, V. ; Rescia, S. ; Kerns, S.

  • Author_Institution
    Argonne National Laboratory
  • fYear
    1990
  • fDate
    22-27 Oct 1990
  • Firstpage
    843
  • Lastpage
    845
  • Keywords
    Bipolar transistors; Electronic equipment testing; Ionizing radiation; JFETs; Laboratories; MOSFETs; Manufacturing; Neutrons; Noise measurement; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1990. Conference record : Including Sessions on Nuclear Power Systems and Medical Imaging Conference, 1990 IEEE
  • Print_ISBN
    0-87942-683-7
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1990.693471
  • Filename
    693471
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1959966