Title :
Third order nonlinear distortion of SAW duplexers in UMTS system
Author :
Chen, Li ; Briot, Jean ; Girard, Pierre ; Ledesma, Carlos ; Solal, Marc ; Cheema, Kamran ; Malocha, Donald ; Wahid, Parveen
Author_Institution :
TriQuint Semicond. Inc., Apopka, FL, USA
Abstract :
Nonlinearity distortion characterization and accurate modeling techniques for leaky surface acoustic wave (LSAW) devices have been desired in the recently years due to the applications of the Radio Frequency (RF) SAW duplexers in the third-generation (3G) telecommunication system, such as Universal Mobile Telecommunications System (UMTS). In the work, we first discuss the approaches to measure and characterize the 3rd order harmonic generation of the resonators on lithium tantalate YX142° wafer and YX148° wafer, with resonance frequency of 800MHz to 900 MHz; Second, we present an effective nonlinear Butterworth-van-Dyke (BVD) model to simulate the multi-tone 3rd order intermodulation effects of a band 5 duplexer; simulation result vs. measurement of 3rd order harmonic generation, 3rd order intermodulation (IMD3) and triple beat are presented.
Keywords :
3G mobile communication; harmonic generation; intermodulation distortion; lithium compounds; resonators; surface acoustic wave devices; 3G telecommunication system; 3rd order harmonic generation; BVD model; IMD3; LSAW devices; RF SAW duplexers; UMTS system; band 5 duplexer; frequency 800 MHz to 900 MHz; leaky surface acoustic wave devices; lithium tantalate; modeling techniques; multitone 3rd order intermodulation effects; nonlinear Butterworth-van-Dyke model; nonlinearity distortion characterization; radio frequency SAW duplexers; resonance frequency; resonators; third order nonlinear distortion; triple beat; universal mobile telecommunications system; Harmonic analysis; Integrated circuit modeling; Power harmonic filters; Power measurement; Resonant frequency; Resonator filters; Surface acoustic waves;
Conference_Titel :
Ultrasonics Symposium (IUS), 2010 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0382-9
DOI :
10.1109/ULTSYM.2010.5935824