Third order nonlinear distortion of SAW duplexers in UMTS system

Author

Chen, Li ; Briot, Jean ; Girard, Pierre ; Ledesma, Carlos ; Solal, Marc ; Cheema, Kamran ; Malocha, Donald ; Wahid, Parveen

Author_Institution

TriQuint Semicond. Inc., Apopka, FL, USA

fYear

2010

fDate

11-14 Oct. 2010

Firstpage

283

Lastpage

286

Abstract

Nonlinearity distortion characterization and accurate modeling techniques for leaky surface acoustic wave (LSAW) devices have been desired in the recently years due to the applications of the Radio Frequency (RF) SAW duplexers in the third-generation (3G) telecommunication system, such as Universal Mobile Telecommunications System (UMTS). In the work, we first discuss the approaches to measure and characterize the 3^rd order harmonic generation of the resonators on lithium tantalate YX142° wafer and YX148° wafer, with resonance frequency of 800MHz to 900 MHz; Second, we present an effective nonlinear Butterworth-van-Dyke (BVD) model to simulate the multi-tone 3^rd order intermodulation effects of a band 5 duplexer; simulation result vs. measurement of 3^rd order harmonic generation, 3^rd order intermodulation (IMD3) and triple beat are presented.

Keywords

3G mobile communication; harmonic generation; intermodulation distortion; lithium compounds; resonators; surface acoustic wave devices; 3G telecommunication system; 3rd order harmonic generation; BVD model; IMD3; LSAW devices; RF SAW duplexers; UMTS system; band 5 duplexer; frequency 800 MHz to 900 MHz; leaky surface acoustic wave devices; lithium tantalate; modeling techniques; multitone 3rd order intermodulation effects; nonlinear Butterworth-van-Dyke model; nonlinearity distortion characterization; radio frequency SAW duplexers; resonance frequency; resonators; third order nonlinear distortion; triple beat; universal mobile telecommunications system; Harmonic analysis; Integrated circuit modeling; Power harmonic filters; Power measurement; Resonant frequency; Resonator filters; Surface acoustic waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium (IUS), 2010 IEEE

Conference_Location

San Diego, CA

ISSN

1948-5719

Print_ISBN

978-1-4577-0382-9

Type

conf

DOI

10.1109/ULTSYM.2010.5935824

Filename

5935824