DocumentCode
1960062
Title
ARL Electric-field Cage Modeling, Design and Calibration
Author
Hull, David M. ; Vinci, Stephen J. ; Zhang, Yongming
Author_Institution
US Army Res. Lab., Adelphi, MD
fYear
0
fDate
0-0 0
Firstpage
89
Lastpage
89
Abstract
A new electric-field cage is described, capable of generating uniform DC or quasi-static AC electric fields for sensor calibration and testing. This unique facility is a large parallel-plate capacitor with guard rings to control fringing fields. The cage dimensions and endplate voltages can be adjusted to meet the needs of a variety of experiments. The current size is 2.4 m high by 3.0 m wide (endplates) by 4.2 m long (in the field direction). Arbitrary AC waveforms (up to plusmn750 V p-p between 10 Hz and 1 kHz) or DC voltages (up to plusmn60 kV) can be generated in the lab with plate separations between 0.6 m and 4.2 m to generate fields up to 2.5 kV/m (AC) or 200 kV/m (DC). Techniques to minimize corona discharge at the highest voltage levels were used in the construction of the cage. Currently, the accuracy of the E-field in the cage is on the order of 1%, and the directionality of the field is better than 0.5deg over volumes greater than 1 m3 for all anticipated test scenarios. This meets or exceeds the specifications of world-class standards for E-field calibration facilities, and does so in a volume that is 15-500x larger than the facilities described in these standards
Keywords
calibration; capacitors; corona; design engineering; electric fields; electric sensing devices; testing; 1 kHz; 10 Hz; 2.4 m; 3.0 m; 4.2 m; ARL electric-field cage; E-field calibration; corona discharge minimization; fringing fields control; guard rings; large parallel-plate capacitor; quasi-static AC electric fields; sensor calibration; sensor testing; uniform DC electric fields; AC generators; Calibration; Capacitors; Corona; DC generators; Laboratories; Powders; Predictive models; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Field Computation, 2006 12th Biennial IEEE Conference on
Conference_Location
Miami, FL
Print_ISBN
1-4244-0320-0
Type
conf
DOI
10.1109/CEFC-06.2006.1632881
Filename
1632881
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