DocumentCode :
1960166
Title :
Algorithm level re-computing-a register transfer level concurrent error detection technique
Author :
Wu, K. ; Karri, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Polytech. Univ. Brooklyn, NY, USA
fYear :
2001
fDate :
4-8 Nov. 2001
Firstpage :
537
Lastpage :
543
Abstract :
In this paper we propose two algorithm-level time redundancy based Concurrent Error Detection (CED) schemes that exploit diversity in a Register Transfer (RT) level implementation. RT level diversity can be achieved either by changing the operation-to-operator allocation (allocation diversity) or by shifting the operands before re-computation (data diversity). By enabling a fault to affect the normal result and the re-computed result in two different ways, RT level diversity yields good CED capability with low area overhead. We used Synopsys Behavior Compiler (BC) to implement the technique.
Keywords :
VLSI; automatic testing; error detection; fault diagnosis; integrated circuit testing; logic testing; program compilers; redundancy; FIR filter; algorithm-level time redundancy; area overhead; concurrent error detection; data diversity; deep submicron VLSI; operation-to-operator allocation; re-computation; register transfer level; stuck at fault; synopsys behavior complier; Circuit faults; Combinational circuits; Computer errors; Data flow computing; Error correction; Fault detection; Hardware; Logic; Redundancy; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
ISSN :
1092-3152
Print_ISBN :
0-7803-7247-6
Type :
conf
DOI :
10.1109/ICCAD.2001.968702
Filename :
968702
Link To Document :
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