• DocumentCode
    1960179
  • Title

    Tests Of The Radiation Hardness Of Vlsi Integrated Circuits And Silicon Strip Detectors For The SSC Under Neutron, Proton, And Gamma Irradiation

  • Author

    Ziock, H.J. ; Milner, C. ; Sommer, W.F. ; Cartiglia, N. ; DeWitt, J. ; Dorfan, D. ; Hubbard, B. ; Leslie, J. ; O´Shaughnessy, R.F. ; Pitzl, D. ; Rowe, W.A. ; Sadrozinski, H.F.-W. ; Seiden, A. ; Spencer, E. ; Tennenbaum, P. ; Ellison, J. ; Jerger, S. ; Lie

  • Author_Institution
    University of California
  • fYear
    1990
  • fDate
    22-27 Oct 1990
  • Firstpage
    846
  • Lastpage
    853
  • Keywords
    Circuit testing; Gamma ray detection; Gamma ray detectors; Integrated circuit testing; Neutrons; Protons; Radiation detectors; Silicon radiation detectors; Strips; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1990. Conference record : Including Sessions on Nuclear Power Systems and Medical Imaging Conference, 1990 IEEE
  • Print_ISBN
    0-87942-683-7
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1990.693472
  • Filename
    693472