1960179

Tests Of The Radiation Hardness Of Vlsi Integrated Circuits And Silicon Strip Detectors For The SSC Under Neutron, Proton, And Gamma Irradiation

Ziock, H.J. ; Milner, C. ; Sommer, W.F. ; Cartiglia, N. ; DeWitt, J. ; Dorfan, D. ; Hubbard, B. ; Leslie, J. ; O´Shaughnessy, R.F. ; Pitzl, D. ; Rowe, W.A. ; Sadrozinski, H.F.-W. ; Seiden, A. ; Spencer, E. ; Tennenbaum, P. ; Ellison, J. ; Jerger, S. ; Lie

University of California

1990

22-27 Oct 1990

846

853

Circuit testing; Gamma ray detection; Gamma ray detectors; Integrated circuit testing; Neutrons; Protons; Radiation detectors; Silicon radiation detectors; Strips; Very large scale integration;

English

ieee

Nuclear Science Symposium, 1990. Conference record : Including Sessions on Nuclear Power Systems and Medical Imaging Conference, 1990 IEEE

0-87942-683-7

conf

10.1109/NSSMIC.1990.693472

693472