The contribution of contact in non-linearity of CV characteristic of thick film resistor

Author

Pelikánová, Ivana Beshajová

Author_Institution

Dept. of Electrotechnol., CTU in Prague, Prague, Czech Republic

fYear

2011

fDate

11-15 May 2011

Firstpage

327

Lastpage

330

Abstract

The work deals with thick film resistors and their properties. The structures of resistive and conductive thick film layers were prepared by screen-printing by polymer thick film pastes. Samples were exposed to accelerated ageing in environment with enhanced temperature and humidity. Tested sample consist of thick film resistors with different width and length. The non-linearity of current-voltage characteristic of resistors was measured. The measured resistor include not only resistive layer but also interface between conductive and resistive layers. The influence such interface is analyzed.

Keywords

ageing; humidity; polymer films; thick film resistors; CV characteristic nonlinearity; accelerated ageing; conductive layer; conductive thick film layers structure; contact contribution; current-voltage characteristic; enhanced temperature; humidity; measured resistor; polymer thick film pastes; resistive layer; resistive thick film layers structure; screen-printing; thick film resistors; Aging; Harmonic analysis; Humidity; Resistance; Resistors; Thick films; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Technology (ISSE), 2011 34th International Spring Seminar on

Conference_Location

Tratanska Lomnica

ISSN

2161-2528

Print_ISBN

978-1-4577-2111-3

Type

conf

DOI

10.1109/ISSE.2011.6053882

Filename

6053882