• DocumentCode
    1961016
  • Title

    The use of inverse layout trees for hierarchical design verification

  • Author

    Hedenstierna, N. ; Jeppson, K.O.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
  • fYear
    1988
  • fDate
    7-10 Nov. 1988
  • Firstpage
    534
  • Lastpage
    537
  • Abstract
    The authors present the inverse layout tree as a means of performing fully hierarchical design verification without any restrictions on subcell overlaps. This provides a fast and general method of marking design rule errors or extracted devices at the correct hierarchical level. The inverse layout tree for each element is built up as layout data is processed from the bottom up. When layout processing is completed one can go through the layout again and use the inverse layout trees to determine the most appropriate cell for each element. New elements formed as layout from different cells overlap can now be placed at the lowest level of hierarchy where they always appear instead of being indiscriminately incorporated in the parent cell. The method preserves the original hierarchy to the greatest possible extent. The method has been implemented in the corner-based design-rule checker and circuit extractor, Corny. As an important example it is shown that logical DIFF (ANDNOT) operations between layers can be performed fully hierarchically.<>
  • Keywords
    circuit layout CAD; data structures; trees (mathematics); ANDNOT operations; Corny; circuit extractor; corner-based design-rule checker; hierarchical design verification; inverse layout trees; layout data; logical DIFF operations; parent cell; Computer errors; Data mining; Design engineering; Design methodology; Displays; Error correction; Solid state circuit design; Solid state circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-0869-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1988.122565
  • Filename
    122565