DocumentCode :
1961444
Title :
A new SOI MOSFET for low power applications
Author :
Lee, Jong-Wook ; Kim, H.-K. ; Oh, J.-H. ; Yang, J.-W. ; Lee, W.-C. ; Kim, Jin-Soo ; Oh, M.-R. ; Koh, Y.-H.
Author_Institution :
Semicond. Res. Div., Hyundai Electron. Ind. Co., Kyoungki-do, South Korea
fYear :
1998
fDate :
5-8 Oct. 1998
Firstpage :
65
Lastpage :
66
Abstract :
SOI devices have attracted a great deal of interest due to their inherent advantages for low power and high performance applications. Assaderaghi et al. proposed the DTMOS (dynamic threshold-voltage MOSFET) for ultra-low voltage VLSI applications (1997). Several researchers proposed a modified SOI MOSFET with the channel body connected to the drain through a small auxiliary MOSFET (Chung et al. 1996; Houston, 1997) to increase the operating voltage. In this paper, we propose a new SOI MOSFET with an auxiliary MOSFET in which the gate and drain are shorted to the gate of the main transistor and the source is connected to the channel body of the main transistor. This auxiliary transistor applies a positive bias to the channel body of the main transistor. In this paper, we present some experimental data and compare the proposed device with a conventional MOSFET, a DTMOS, and the modified SOI MOSFET proposed by Chung et al.
Keywords :
MOSFET; semiconductor device testing; silicon-on-insulator; DTMOS; SOI MOSFET; SOI devices; auxiliary MOSFET; drain-connected channel body; dynamic threshold-voltage MOSFET; high performance applications; low power applications; main transistor channel body; main transistor gate; modified SOI MOSFET; operating voltage; positive bias; shorted drain; shorted gate; ultra-low voltage VLSI applications; Capacitance measurement; Charge measurement; Current measurement; Electric variables; Length measurement; MOSFET circuits; Power MOSFET; Virtual manufacturing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1998. Proceedings., 1998 IEEE International
Conference_Location :
Stuart, FL, USA
ISSN :
1078-621X
Print_ISBN :
0-7803-4500-2
Type :
conf
DOI :
10.1109/SOI.1998.723113
Filename :
723113
Link To Document :
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