• DocumentCode
    1961502
  • Title

    Nanometer-scale InGaAs Field-Effect Transistors for THz and CMOS technologies

  • Author

    del Alamo, Jesus A.

  • Author_Institution
    Microsyst. Technol. Labs., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2013
  • fDate
    16-20 Sept. 2013
  • Firstpage
    16
  • Lastpage
    21
  • Abstract
    Integrated circuits based on InGaAs Field Effect Transistors are currently in wide use in the RF front-ends of smart phones and other mobile platforms, wireless LANs, high data rate fiber-optic links and many defense and space communication systems. InGaAs ICs are also under intense research for new millimeter-wave applications such as collision avoidance radar and gigabit WLANs. InGaAs FET scaling has nearly reached the end of the road and further progress to propel this technology to the THz regime will require significant device innovations. Separately, as Si CMOS faces mounting difficulties to maintain its historical density scaling path, InGaAs-channel MOSFETs have recently emerged as a credible alternative for mainstream logic technology capable of scaling to the 10 nm node and below. To get to this point, fundamental technical problems had to be solved though there are still many challenges to be addressed before the first non-Si CMOS technology becomes a reality. The intense research that this exciting prospect is generating is also reinvigorating the prospects of InGaAs FETs to become the first true THz electronics technology. This paper reviews progress and challenges of InGaAs-based FET technology for THz and CMOS.
  • Keywords
    CMOS integrated circuits; III-V semiconductors; MOSFET; gallium arsenide; high electron mobility transistors; indium compounds; nanoelectronics; terahertz wave devices; CMOS technology; InGaAs; MOSFETs; THz electronics technology; high electron mobility transistors; nanometer-scale InGaAs field-effect transistors; CMOS integrated circuits; HEMTs; Indium gallium arsenide; Logic gates; MODFETs; MOSFET; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2013 Proceedings of the
  • Conference_Location
    Bucharest
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4799-0643-7
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2013.6649061
  • Filename
    6649061