Title :
A supply-noise-rejection technique in ADPLL with noise-cancelling current source
Author :
Niki, Y. ; Miyashita, D. ; Kobayashi, Hideo ; Kousai, Shouhei
Author_Institution :
Center for Semicond. R&D, Toshiba Corp., Kawasaki, Japan
Abstract :
We propose a supply noise rejection technique, which is applied to an all-digital phase-locked loop (ADPLL). Supply noise is cancelled by adding a cancellation current whose fluctuation is the same as that of a supply-noise component in an oscillator current. The proposed technique is realized with a small area and current dissipation, and is tolerant to process, voltage, and temperature (PVT) variations without calibration. The proof-of-concept chip was fabricated using a 65 nm CMOS technology. It was measured that the peak-to-peak jitter was reduced by 54 % in the presence of 30 mVpp, 15 MHz supply noise, and the robustness of the proposed technique was verified by the measurements.
Keywords :
CMOS digital integrated circuits; digital phase locked loops; interference suppression; CMOS technology; all-digital phase-locked loop; cancellation current; current dissipation; frequency 15 MHz; oscillator current; peak-to-peak jitter; process, voltage, and temperaturevariations; proof-of-concept chip; size 65 nm; supply-noise component; supply-noise-rejection technique; voltage 30 mV; Frequency measurement; Jitter; Noise; Noise measurement; Phase locked loops; Ring oscillators;
Conference_Titel :
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location :
Bucharest
Print_ISBN :
978-1-4799-0643-7
DOI :
10.1109/ESSCIRC.2013.6649068