DocumentCode
1961733
Title
Design and optimization of double-gate SOI MOSFETs for low voltage low power circuits
Author
Wei, L. ; Chen, Z. ; Roy, K.
Author_Institution
Dept. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
1998
fDate
5-8 Oct. 1998
Firstpage
69
Lastpage
70
Abstract
With the growing use of portable and wireless electronic systems, design of high performance, low-voltage, low-power digital devices and circuits has become an important concern for VLSI applications. The double-gate (DG) fully-depleted (FD) silicon-on-insulator (SOI) MOSFET has an ideal subthreshold slope, high drive current and superb short channel effect immunity, which makes it very attractive in low-voltage, low-power, and high-performance CMOS designs. In this paper, by solving the Poisson equation, we propose a general model which has been verified by SOI-SPICE simulations. Based on this model, DGSOI MOSFETs are compared with conventional single gate FD SOI (SGSOI) MOSFETs, and the design and optimization of DGSOI MOSFETs in terms of circuit delay, power dissipation and power delay product are presented. In our analysis, we focus on FD DGSOI transistors without volume inversion, where the classical method is still valid.
Keywords
CMOS digital integrated circuits; MOSFET; Poisson equation; SPICE; circuit simulation; integrated circuit design; optimisation; semiconductor device models; silicon-on-insulator; CMOS designs; DGSOI MOSFETs; FD DGSOI transistors; Poisson equation; SOI-SPICE simulations; VLSI applications; circuit delay; digital circuits; digital devices; double-gate SOI MOSFET design; double-gate SOI MOSFET optimization; double-gate fully-depleted SOI MOSFET; double-gate fully-depleted silicon-on-insulator MOSFET; drive current; general SOI MOSFET model; low power circuits; low voltage circuits; portable electronic systems; power delay product; power dissipation; short channel effect immunity; single gate FD SOI MOSFETs; subthreshold slope; volume inversion; wireless electronic systems; Circuit simulation; Delay; Design optimization; Low voltage; MOSFETs; Poisson equations; Power dissipation; Semiconductor device modeling; Silicon on insulator technology; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1998. Proceedings., 1998 IEEE International
Conference_Location
Stuart, FL, USA
ISSN
1078-621X
Print_ISBN
0-7803-4500-2
Type
conf
DOI
10.1109/SOI.1998.723115
Filename
723115
Link To Document