Title :
Use of transistor parameters when designing microwave transistor oscillators
Author :
Henoch, Bengt T ; de Faro Orlando, Alberto Faro
Author_Institution :
Microwave Department, Royal Institute of Technology, Stockholm, Sweden
Keywords :
Capacitance measurement; Conformal mapping; Current measurement; Equivalent circuits; Frequency; Microwave oscillators; Microwave theory and techniques; Microwave transistors; Time measurement; Voltage;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331938
