Title :
A 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibration
Author :
Chang, Arthur H. ; Hae-Seung Lee ; Boning, D.
Author_Institution :
Microsyst. Technol. Labs., MIT, Cambridge, MA, USA
Abstract :
A 12-bit 50MS/s SAR ADC implemented in 65nm CMOS technology is presented. The design employs redundancy to relax the DAC settling requirement and to provide sufficient room for errors such that the static nonlinearity caused by capacitor mismatches can be digitally removed. The redundancy is incorporated into the design using a tri-level switching scheme and our modified split-capacitor array to achieve the highest switching efficiency while still preserving the symmetry in error tolerance. A new code-density based digital background calibration algorithm that requires no special calibration signals or additional analog hardware is also developed. The calibration is performed by using the input signal as stimulus and the effectiveness is verified both in simulation and through measured data. The prototype achieves a 67.4dB SNDR at 50MS/s, while dissipating 2.1mW from a 1.2V supply, leading to FoM of 21.9fJ/conv.-step at Nyquist frequency.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; calibration; capacitors; digital-analogue conversion; CMOS technology; DAC settling requirement; FoM; Nyquist frequency; SAR ADC; capacitor mismatches; code-density based digital background calibration algorithm; error tolerance symmetry; noise figure 67.4 dB; power 2.1 mW; size 65 nm; split-capacitor array; static nonlinearity; switching efficiency; tri-level switching scheme; voltage 1.2 V; word length 12 bit; Algorithm design and analysis; CMOS integrated circuits; Calibration; Capacitors; Complexity theory; Redundancy; Switches;
Conference_Titel :
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location :
Bucharest
Print_ISBN :
978-1-4799-0643-7
DOI :
10.1109/ESSCIRC.2013.6649084