Title :
Multiparameter Electronics Systems Control Probabilistic Evaluation
Author :
Eidukas, Danielius ; Kalnius, Rimantas
Author_Institution :
Dept. of Electron. Eng., Kaunas Univ. of Technol., Kaunas, Lithuania
Abstract :
This publication is about continuous operational control main probabilities characteristics modeling techniques for multilevel electronics systems. These are useful when separate independent parameters defect level probabilities distributions are set (known) for chosen (selected) control schematics place. Denied electronics systems streams goes back to production process for regeneration and electronics systems classification rules in different control levels are similar, when electronics system classification first and second type errors are not denied by different parameters (good is denied or bad is accepted as good). Offered to use approximated models instead of exact whole electronics system defect level probabilities density transformed models because of complicated process of integration.
Keywords :
control systems; electronics industry; integrated circuit manufacture; probability; semiconductor process modelling; classification first type errors; classification rules; classification second type errors; continuous operational control; control probabilistic evaluation; control schematics place; defect level probability density transformed model; defect level probability distributions; integration process; multilevel electronics systems; multiparameter electronics systems; Control system analysis; Control system synthesis; Control systems; Databases; Distribution functions; Manufacturing processes; Probability; Production systems; Quality control; Stochastic processes; electronics systems; probabilistic evaluation; probabilities density;
Conference_Titel :
Advances in Circuits, Electronics and Micro-electronics, 2009. CENICS '09. Second International Conference on
Conference_Location :
Sliema
Print_ISBN :
978-0-7695-3832-7
DOI :
10.1109/CENICS.2009.26