Title :
Silicon NPN Low-Noise Microwave Transistors
Author :
Hughes, E. ; Hinds, DJ ; Wadham, E.
Author_Institution :
General Electric Company Limited, Semiconductor Laboratories, Hirst Research Centre, Wembley, England.
Keywords :
Capacitance; Circuit noise; Encapsulation; Equations; Microwave devices; Microwave transistors; Noise figure; Noise measurement; Performance gain; Silicon;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331956
