DocumentCode :
1962228
Title :
Physical Behaviour and Technical Applications of Metal-Insulator Semiconductor Varactors
Author :
Schiek, B. ; Marquard, J. ; Helmcke, J.
Author_Institution :
Institut fur Hochfrequenztechnik,Technische Universitat Braunschweig,Germany
fYear :
1969
fDate :
8-12 Sept. 1969
Firstpage :
520
Lastpage :
523
Keywords :
Breakdown voltage; Capacitance; Frequency; Impact ionization; Insulation; Metal-insulator structures; Silicon; Surface resistance; Transient response; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
Type :
conf
DOI :
10.1109/EUMA.1969.331961
Filename :
4130630
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1962228
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