• DocumentCode
    1962228
  • Title

    Physical Behaviour and Technical Applications of Metal-Insulator Semiconductor Varactors

  • Author

    Schiek, B. ; Marquard, J. ; Helmcke, J.

  • Author_Institution
    Institut fur Hochfrequenztechnik,Technische Universitat Braunschweig,Germany
  • fYear
    1969
  • fDate
    8-12 Sept. 1969
  • Firstpage
    520
  • Lastpage
    523
  • Keywords
    Breakdown voltage; Capacitance; Frequency; Impact ionization; Insulation; Metal-insulator structures; Silicon; Surface resistance; Transient response; Varactors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1969. 1st European
  • Conference_Location
    London, UK
  • Type

    conf

  • DOI
    10.1109/EUMA.1969.331961
  • Filename
    4130630
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1962228