Title :
Single Electron Fault in QCA Binary Wire
Author :
Mahdavi, Mojdeh ; Amiri, Mohammad Amin ; Mirzakuchaki, Sattar
Author_Institution :
Shahr-e-Qods-Branch, Islamic Azad Univ., Shahr-e-Qods, Iran
Abstract :
Quantum cellular automata (QCA) represents an emerging technology at the nanotechnology level. There are various faults which may occur in QCA cells. One of these faults is the single electron fault (SEF) that can happen during manufacturing or operation of QCA circuits. A detailed simulation based logic level modeling of single electron fault for QCA binary wire is represented in this paper.
Keywords :
cellular automata; quantum wires; QCA binary wire; quantum cellular automata; single electron fault; Circuit faults; Electrons; Energy consumption; Logic circuits; Manufacturing; Quantum cellular automata; Quantum dots; Quantum mechanics; Stationary state; Wire; Binary Wire; QCA; Single Electron Fault;
Conference_Titel :
Advances in Circuits, Electronics and Micro-electronics, 2009. CENICS '09. Second International Conference on
Conference_Location :
Sliema
Print_ISBN :
978-0-7695-3832-7
DOI :
10.1109/CENICS.2009.19
