• DocumentCode
    1962434
  • Title

    Single Electron Fault in QCA Binary Wire

  • Author

    Mahdavi, Mojdeh ; Amiri, Mohammad Amin ; Mirzakuchaki, Sattar

  • Author_Institution
    Shahr-e-Qods-Branch, Islamic Azad Univ., Shahr-e-Qods, Iran
  • fYear
    2009
  • fDate
    11-16 Oct. 2009
  • Firstpage
    8
  • Lastpage
    10
  • Abstract
    Quantum cellular automata (QCA) represents an emerging technology at the nanotechnology level. There are various faults which may occur in QCA cells. One of these faults is the single electron fault (SEF) that can happen during manufacturing or operation of QCA circuits. A detailed simulation based logic level modeling of single electron fault for QCA binary wire is represented in this paper.
  • Keywords
    cellular automata; quantum wires; QCA binary wire; quantum cellular automata; single electron fault; Circuit faults; Electrons; Energy consumption; Logic circuits; Manufacturing; Quantum cellular automata; Quantum dots; Quantum mechanics; Stationary state; Wire; Binary Wire; QCA; Single Electron Fault;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Circuits, Electronics and Micro-electronics, 2009. CENICS '09. Second International Conference on
  • Conference_Location
    Sliema
  • Print_ISBN
    978-0-7695-3832-7
  • Type

    conf

  • DOI
    10.1109/CENICS.2009.19
  • Filename
    5291510
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1962434