Title :
Low short term timing jitter in an integrated monolithic extended cavity semiconductor mode-locked laser
Author :
Wonfor, A. ; Zhu, B. ; White, I.H. ; Penty, R.V.
Author_Institution :
Centre for Commun. Res., Bristol Univ., UK
Abstract :
In conclusion although uncorrelated jitter of several picoseconds is measured for this DFB semiconductor laser device, the short term timing jitter is shown to be significantly sub-picosecond, using a new direct measurement technique.
Keywords :
distributed feedback lasers; high-speed optical techniques; integrated optoelectronics; jitter; laser theory; laser variables measurement; semiconductor device models; semiconductor lasers; DFB semiconductor laser device; direct measurement technique; integrated monolithic extended cavity semiconductor mode-locked laser; low short term timing jitter; picoseconds; uncorrelated jitter; Delay effects; Laser mode locking; Microwave measurements; Optical attenuators; Optical fiber polarization; Optical harmonic generation; Optical interferometry; Optical pulses; Pulse measurements; Timing jitter;
Conference_Titel :
Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
Conference_Location :
Montreal, Que., Canada
Print_ISBN :
0-7803-3891-X
DOI :
10.1109/LEOSST.1997.619223
