Low short term timing jitter in an integrated monolithic extended cavity semiconductor mode-locked laser

Author

Wonfor, A. ; Zhu, B. ; White, I.H. ; Penty, R.V.

Author_Institution

Centre for Commun. Res., Bristol Univ., UK

fYear

1997

fDate

11-13 Aug. 1997

Firstpage

64

Lastpage

65

Abstract

In conclusion although uncorrelated jitter of several picoseconds is measured for this DFB semiconductor laser device, the short term timing jitter is shown to be significantly sub-picosecond, using a new direct measurement technique.

Keywords

distributed feedback lasers; high-speed optical techniques; integrated optoelectronics; jitter; laser theory; laser variables measurement; semiconductor device models; semiconductor lasers; DFB semiconductor laser device; direct measurement technique; integrated monolithic extended cavity semiconductor mode-locked laser; low short term timing jitter; picoseconds; uncorrelated jitter; Delay effects; Laser mode locking; Microwave measurements; Optical attenuators; Optical fiber polarization; Optical harmonic generation; Optical interferometry; Optical pulses; Pulse measurements; Timing jitter;

fLanguage

English

Publisher

ieee

Conference_Titel

Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi

Conference_Location

Montreal, Que., Canada

Print_ISBN

0-7803-3891-X

Type

conf

DOI

10.1109/LEOSST.1997.619223

Filename

619223