DocumentCode
1962700
Title
Why design reliable chips when faulty ones are even better
Author
Palem, Krishna ; Lingamneni, Avinash ; Enz, Christian ; Piguet, Christian
Author_Institution
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
fYear
2013
fDate
16-20 Sept. 2013
Firstpage
255
Lastpage
258
Abstract
Moore´s law, the driving force behind the computing technology revolution is widely expected to face limiting, if not disruptive, hurdles within the next 5 years or so, owing in part to its inability to cope with the errors arising from device variations and perturbations as well as the accompanying increased power density in deep nanoscale CMOS regime. To overcome these twin hurdles and in a sharp contrast to that of conventional research based on von Neumann´s legacy of designing reliable hardware from unreliable components, we adopt a radically different philosophy of designing unreliable hardware from reliable or unreliable components, wherein we take advantage of the inherent- or induced- errors in the circuits to achieve significant cost (in terms of size, energy, design, performance, manufacturing and verification) savings. Our approach not only is sensitive to the value of information, thereby producing good enough designs of lesser cost but also opens an entirely new design space where perceptual- and statistical-limitations (and hence, the desired quality) is a dimension that can be traded off.
Keywords
integrated circuit reliability; microprocessor chips; Moore´s law; computing technology revolution; design reliable chips; driving force; faulty ones; sharp contrast; unreliable hardware; von Neumann legacy; Adders; Algorithm design and analysis; CMOS integrated circuits; Hardware; Probabilistic logic; Reliability; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location
Bucharest
ISSN
1930-8833
Print_ISBN
978-1-4799-0643-7
Type
conf
DOI
10.1109/ESSCIRC.2013.6649121
Filename
6649121
Link To Document