• DocumentCode
    1962700
  • Title

    Why design reliable chips when faulty ones are even better

  • Author

    Palem, Krishna ; Lingamneni, Avinash ; Enz, Christian ; Piguet, Christian

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
  • fYear
    2013
  • fDate
    16-20 Sept. 2013
  • Firstpage
    255
  • Lastpage
    258
  • Abstract
    Moore´s law, the driving force behind the computing technology revolution is widely expected to face limiting, if not disruptive, hurdles within the next 5 years or so, owing in part to its inability to cope with the errors arising from device variations and perturbations as well as the accompanying increased power density in deep nanoscale CMOS regime. To overcome these twin hurdles and in a sharp contrast to that of conventional research based on von Neumann´s legacy of designing reliable hardware from unreliable components, we adopt a radically different philosophy of designing unreliable hardware from reliable or unreliable components, wherein we take advantage of the inherent- or induced- errors in the circuits to achieve significant cost (in terms of size, energy, design, performance, manufacturing and verification) savings. Our approach not only is sensitive to the value of information, thereby producing good enough designs of lesser cost but also opens an entirely new design space where perceptual- and statistical-limitations (and hence, the desired quality) is a dimension that can be traded off.
  • Keywords
    integrated circuit reliability; microprocessor chips; Moore´s law; computing technology revolution; design reliable chips; driving force; faulty ones; sharp contrast; unreliable hardware; von Neumann legacy; Adders; Algorithm design and analysis; CMOS integrated circuits; Hardware; Probabilistic logic; Reliability; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2013 Proceedings of the
  • Conference_Location
    Bucharest
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4799-0643-7
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2013.6649121
  • Filename
    6649121