DocumentCode :
1962787
Title :
In-situ performance monitor employing threshold based notifications (TheBaN)
Author :
Gemmeke, T. ; Konijnenburg, Mario ; Bachmann, Christian
Author_Institution :
Holst-Centre / imec, Eindhoven, Netherlands
fYear :
2013
fDate :
16-20 Sept. 2013
Firstpage :
271
Lastpage :
274
Abstract :
In-situ performance monitoring offers significantly better voltage scaling potential than classic ring-oscillator based approaches as it eliminates the uncertainty due to local random variations. The major challenge of such an approach is the timely generation of signaling events to control the voltage level at the most energy efficient point still offering reliable operation. In this paper we present a novel threshold based notification scheme together with a detailed analysis of corner cases. The presented measurement results are based on an implementation in a digital signal processor in a 40nm low-power technology achieving an effective voltage margin as low as 5mV.
Keywords :
low-power electronics; signal processing equipment; digital signal processor; in-situ performance monitor; low-power technology; size 40 nm; threshold based notifications; voltage scaling potential; Delays; Logic gates; Monitoring; Temperature measurement; Temperature sensors; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location :
Bucharest
ISSN :
1930-8833
Print_ISBN :
978-1-4799-0643-7
Type :
conf
DOI :
10.1109/ESSCIRC.2013.6649125
Filename :
6649125
Link To Document :
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