DocumentCode
1962826
Title
Fabrication of a PMOS Transistor at NGEE ANN POLYTECHNIC´s IC fabrication facility
Author
Philip, Matthew
Author_Institution
Microelectron. Design & Application Center, Ngee Ann Polytech., Singapore, Singapore
fYear
2003
fDate
30 June-2 July 2003
Firstpage
326
Lastpage
327
Abstract
NGEE ANN POLYTECHNIC´s IC Fabrication Facility (NPFab) was set up in 1998 with the mission to train manpower for the microelectronics industry of Singapore. The facility has been used since then to provide practical training in nearly all aspects of wafer fabrication to final-year students. In addition to equipment and process training on individual stations, interested students undertake final-year projects in the clean room. These involve the construction and testing of microelectronic devices and circuits. This paper describes one such work to build and test a PMOS Metal Gate Transistor. Details of the process flow and test strategies utilized are provided. Problems encountered and solutions taken are reported. The impact of the exercise on student learning is assessed.
Keywords
MOS integrated circuits; MOSFET; integrated circuit design; IC fabrication; PMOS metal gate transistor fabrication; microelectronic devices; microelectronics industry; train manpower; Circuit testing; Conductivity; Construction industry; Fabrication; Industrial training; MOSFETs; Microelectronics; Process design; Resists; Textile industry;
fLanguage
English
Publisher
ieee
Conference_Titel
University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
ISSN
0749-6877
Print_ISBN
0-7803-7972-1
Type
conf
DOI
10.1109/UGIM.2003.1225754
Filename
1225754
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