DocumentCode
1962852
Title
A device to demonstrate the Haynes-Shockley Experiment
Author
Philip, Matthew
Author_Institution
Microelectron. Design & Application Center, Ngee Ann Polytech., Singapore, Singapore
fYear
2003
fDate
30 June-2 July 2003
Firstpage
330
Lastpage
331
Abstract
The celebrated Haynes-Shockley Experiment was devised in 1951 by J. Haynes and W. Shockley to demonstrate basic carrier transport phenomena. This experiment allows diffusion, drift and recombination to be investigated in a simple yet deeply insightful manner. This paper describes an attempt to build and test a device that can be used to demonstrate the Haynes Shockley Experiment. Details of the process flow and test strategies utilized are provided. Problems encountered and solutions taken are reported.
Keywords
carrier mobility; electron-hole recombination; masks; ohmic contacts; transistors; Haynes-Shockley device; Si-SiO2; carrier transport; diffusion; recombination; Adhesives; Electrodes; Fabrication; Glass; Ink; Microscopy; Painting; Process design; Radiative recombination; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
ISSN
0749-6877
Print_ISBN
0-7803-7972-1
Type
conf
DOI
10.1109/UGIM.2003.1225756
Filename
1225756
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