Title :
Automated testing and parameter extraction of solar cells fabricated from 6-8 inch large test wafers
Author :
Guvenc, M.G. ; Gurcan, C. ; Denis, A.M. ; MacDonald, D.
Author_Institution :
Univ. of Southern Maine, Portland, ME, USA
fDate :
30 June-2 July 2003
Abstract :
This paper describes the design, operation and use of a PC controlled test setup designed specifically to measure the I-V characteristics of large area solar cells operated under simulated solar irradiation for the purpose of testing their quality and determining their optimal operation points for maximum electrical output. The project included design of a wafer-prober and solar-simulator combination so that large area wafers could be tested.
Keywords :
CAMAC; short-circuit currents; solar absorber-convertors; solar cells; 6 to 8 inch; automated testing; current-voltage curves; electrical output; large test wafers; optimal operation; parameter extraction; simulated solar irradiation; solar cells; wafer prober-solar simulator; Automatic testing; Current measurement; Lamps; Parameter extraction; Photovoltaic cells; Semiconductor device testing; Short circuit currents; Silicon; Solar radiation; Voltage;
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
Print_ISBN :
0-7803-7972-1
DOI :
10.1109/UGIM.2003.1225768
