• DocumentCode
    1963286
  • Title

    A fabrication laboratory course based on GaAs MESFETs

  • Author

    Roenker, Kenneth P. ; Flenniken, Ron ; Kosel, Peter B.

  • Author_Institution
    Dept. of Electr. & Comput. Eng. & Comput. Sci., Cincinnati Univ., OH, USA
  • fYear
    2003
  • fDate
    30 June-2 July 2003
  • Firstpage
    391
  • Lastpage
    397
  • Abstract
    This paper describes the organization and operation of an introductory, dual level (senior/graduate) laboratory course on semiconductor device processing that is based on the fabrication and testing of GaAs MESFETs. The course is organized into a weekly lecture with a corresponding laboratory session. Over the period of one quarter, the students are led through a four mask process for fabricating n-channel GaAs MESFETs. The last three weeks of the course are utilized to perform electrical characterization of the devices and test structures incorporated in the test chip. This paper provides a description of the breakdown of the fabrication process in weekly increments, the topics covered in the accompanying lecture, resource materials provided to the student, methods used for student assessment, facilities and staffing requirements, and student capacity.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; capacitance; contact resistance; educational courses; gallium arsenide; ion implantation; leakage currents; masks; photolithography; sputter etching; student experiments; training; GaAs; dual level senior/graduate laboratory course; electrical properties; facilities; mask process; n-channel GaAs MESFET testing; resource materials; semiconductor device processing; staffing requirements; student assessment; student capacity; weekly lecture; Computer science; Fabrication; Gallium arsenide; Laboratories; MESFETs; MOSFETs; P-n junctions; Performance evaluation; Semiconductor device testing; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-7972-1
  • Type

    conf

  • DOI
    10.1109/UGIM.2003.1225778
  • Filename
    1225778