DocumentCode :
1963310
Title :
A high-level fault modeling technique using CONES
Author :
Jou, Jing-yang ; Lin, Tonysheng
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1989
fDate :
14-16 Aug 1989
Firstpage :
287
Abstract :
A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T´s in-house CAD tools. The experiments show fairly promising and interesting results
Keywords :
C language; CAD; digital simulation; fault location; software tools; C-modeled primitives; CAD tools; CONES; fault effects; fault simulation; functional primitives; high-level fault modeling technique; high-level synthesis tool; internal faults; optimized two-level implementation; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Equations; High level synthesis; Power system modeling; Probability; Sampling methods; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
Conference_Location :
Champaign, IL
Type :
conf
DOI :
10.1109/MWSCAS.1989.101848
Filename :
101848
Link To Document :
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