• DocumentCode
    1963310
  • Title

    A high-level fault modeling technique using CONES

  • Author

    Jou, Jing-yang ; Lin, Tonysheng

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • fYear
    1989
  • fDate
    14-16 Aug 1989
  • Firstpage
    287
  • Abstract
    A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T´s in-house CAD tools. The experiments show fairly promising and interesting results
  • Keywords
    C language; CAD; digital simulation; fault location; software tools; C-modeled primitives; CAD tools; CONES; fault effects; fault simulation; functional primitives; high-level fault modeling technique; high-level synthesis tool; internal faults; optimized two-level implementation; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Equations; High level synthesis; Power system modeling; Probability; Sampling methods; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
  • Conference_Location
    Champaign, IL
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1989.101848
  • Filename
    101848