• DocumentCode
    1963885
  • Title

    Direct frequency metrology Up To PHz frequencies

  • Author

    Pinkert, T.J. ; Morgenweg, Jonas ; Barmes, Itan ; Kandula, D.Z. ; Gohle, C. ; Eikema, Kjeld S. E.

  • Author_Institution
    LaserLaB, VU Univ., Amsterdam, Netherlands
  • fYear
    2012
  • fDate
    23-27 April 2012
  • Firstpage
    235
  • Lastpage
    237
  • Abstract
    The capability of frequency-comb (FC) lasers to precisely measure optical frequencies has been extended to the to the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), corresponding to frequencies of multiple PHz. We demonstrate “broad frequency comb generation” for a wavelength range of 51-85 nm. Our method is based on amplification and coherent up-conversion of a pair of pulses originating from a near-infrared femtosecond FC laser. Excitation of argon, neon, and helium with these upconverted laser pulses in the XUV lead to Ramsey-like signals with up to 61% contrast. From these signals an accuracy of 6 MHz has been achieved in the determination of the ground state ionization energy of helium at 51 nm. Further improvement to a kHz-level accuracy is expected based on a new pump laser for the employed parametric amplification system.
  • Keywords
    amplification; argon; atom-photon collisions; excited states; frequency measurement; ground states; helium neutral atoms; measurement by laser beam; neon; optical frequency conversion; optical pulse generation; optical pumping; optical variables measurement; photoionisation; Ar; He; Ne; PHz frequency; Ramsey-like signals; XUV; broad frequency comb generation; coherent upconversion; direct frequency metrology; frequency 6 MHz; frequency comb laser; ground state ionization energy; near infrared femtosecond FC laser; optical frequency measurement; parametric amplification system; pump laser; upconverted laser pulse; wavelength 51 nm to 85 nm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Frequency and Time Forum (EFTF), 2012
  • Conference_Location
    Gothenburg
  • Print_ISBN
    978-1-4673-1924-9
  • Type

    conf

  • DOI
    10.1109/EFTF.2012.6502373
  • Filename
    6502373