Title :
Direct frequency metrology Up To PHz frequencies
Author :
Pinkert, T.J. ; Morgenweg, Jonas ; Barmes, Itan ; Kandula, D.Z. ; Gohle, C. ; Eikema, Kjeld S. E.
Author_Institution :
LaserLaB, VU Univ., Amsterdam, Netherlands
Abstract :
The capability of frequency-comb (FC) lasers to precisely measure optical frequencies has been extended to the to the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), corresponding to frequencies of multiple PHz. We demonstrate “broad frequency comb generation” for a wavelength range of 51-85 nm. Our method is based on amplification and coherent up-conversion of a pair of pulses originating from a near-infrared femtosecond FC laser. Excitation of argon, neon, and helium with these upconverted laser pulses in the XUV lead to Ramsey-like signals with up to 61% contrast. From these signals an accuracy of 6 MHz has been achieved in the determination of the ground state ionization energy of helium at 51 nm. Further improvement to a kHz-level accuracy is expected based on a new pump laser for the employed parametric amplification system.
Keywords :
amplification; argon; atom-photon collisions; excited states; frequency measurement; ground states; helium neutral atoms; measurement by laser beam; neon; optical frequency conversion; optical pulse generation; optical pumping; optical variables measurement; photoionisation; Ar; He; Ne; PHz frequency; Ramsey-like signals; XUV; broad frequency comb generation; coherent upconversion; direct frequency metrology; frequency 6 MHz; frequency comb laser; ground state ionization energy; near infrared femtosecond FC laser; optical frequency measurement; parametric amplification system; pump laser; upconverted laser pulse; wavelength 51 nm to 85 nm;
Conference_Titel :
European Frequency and Time Forum (EFTF), 2012
Conference_Location :
Gothenburg
Print_ISBN :
978-1-4673-1924-9
DOI :
10.1109/EFTF.2012.6502373