DocumentCode :
1963950
Title :
A memory supplier´s outlook on die products
Author :
Skinner, Dan
Author_Institution :
Micron Technol., Inc., Boise, ID, USA
fYear :
2003
fDate :
16-18 July 2003
Firstpage :
195
Lastpage :
196
Abstract :
Mobile PCs and servers, wireless handsets, personal appliances and other mobile applications are driving the need for high-performance, low-cost, small form factor memory solutions. For this reason, die products as well as integrated packaging technologies are increasingly more prevalent as memory solutions designed into these applications. System designs are increasingly implementing integrated packaging strategies, such as the multichip package (MCP) or stacked package and system in package (SiP) products. The growth in die product demand is reflected in semiconductor manufacturers development of new production and test processes to enable the production of die products with a higher yield. The applications integrating die products are diverse, each one with its own form factor and device characteristic requirements. The emergence of several new packaging and die product solutions offers designers options and the ability to pick the technology that best meets their design requirements. The wafer level chip scale package (WLCSP) is an example of an emerging packaging technology. WLCSP with a redistribution layer (RDL) applied provides many advantages over the standard thin small outline package (TSOP) and ball grid array (BGA) packages including electrical, thermal, and mechanical properties.
Keywords :
ball grid arrays; chip scale packaging; random-access storage; semiconductor technology; wafer bonding; ball grid array packages; die products; electrical properties; integrated packaging technologies; mechanical properties; memory solutions; mobile PC; mobile applications; multichip package; packaging technology; redistribution layer; semiconductor manufacturers; stacked package; test processes; thermal properties; thin small outline package; wafer level chip scale package; wireless handsets; Chip scale packaging; Home appliances; Manufacturing processes; Personal communication networks; Production; Semiconductor device manufacture; Semiconductor device packaging; Semiconductor device testing; Telephone sets; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. IEEE/CPMT/SEMI 28th International
ISSN :
1089-8190
Print_ISBN :
0-7803-7933-0
Type :
conf
DOI :
10.1109/IEMT.2003.1225898
Filename :
1225898
Link To Document :
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