Title :
Substrate effects on GaN photodetector performance
Author :
Smith, G.M. ; Redwing, J.M. ; Flynn, J.S. ; Phanse, V.M. ; Vaudo, R.P.
Author_Institution :
Epitronics ATMI, Danbury, CT, USA
Abstract :
Solar-blind UV photodetectors have a number of applications including missile detection, flame sensing, and solar UV monitoring. The III-V nitrides are ideal for these applications due to their wide bandgaps, making detectors transparent to visible and infrared radiation. There have been several publications on photoconductive GaN detectors on sapphire substrates but the effects of defect density on device performance have not been investigated. In this paper we describe the operation of GaN detectors grown by MOCVD on sapphire, SiC, and thick HVPE GaN base layers and compare the device performance of the detectors on each of these substrates.
Keywords :
CVD coatings; III-V semiconductors; gallium compounds; photoconducting devices; photodetectors; substrates; ultraviolet detectors; wide band gap semiconductors; Al/sub 2/O/sub 3/; GaN; MOCVD; SiC; defect density; photoconductive GaN detector; sapphire substrate; solar-blind UV photodetector; wide bandgap III-V nitride; Fires; Gallium nitride; III-V semiconductor materials; Infrared detectors; Missiles; Monitoring; Photoconducting devices; Photodetectors; Photonic band gap; Radiation detectors;
Conference_Titel :
Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
Conference_Location :
Montreal, Que., Canada
Print_ISBN :
0-7803-3891-X
DOI :
10.1109/LEOSST.1997.619243