• DocumentCode
    1964059
  • Title

    Substrate effects on GaN photodetector performance

  • Author

    Smith, G.M. ; Redwing, J.M. ; Flynn, J.S. ; Phanse, V.M. ; Vaudo, R.P.

  • Author_Institution
    Epitronics ATMI, Danbury, CT, USA
  • fYear
    1997
  • fDate
    11-13 Aug. 1997
  • Firstpage
    21
  • Abstract
    Solar-blind UV photodetectors have a number of applications including missile detection, flame sensing, and solar UV monitoring. The III-V nitrides are ideal for these applications due to their wide bandgaps, making detectors transparent to visible and infrared radiation. There have been several publications on photoconductive GaN detectors on sapphire substrates but the effects of defect density on device performance have not been investigated. In this paper we describe the operation of GaN detectors grown by MOCVD on sapphire, SiC, and thick HVPE GaN base layers and compare the device performance of the detectors on each of these substrates.
  • Keywords
    CVD coatings; III-V semiconductors; gallium compounds; photoconducting devices; photodetectors; substrates; ultraviolet detectors; wide band gap semiconductors; Al/sub 2/O/sub 3/; GaN; MOCVD; SiC; defect density; photoconductive GaN detector; sapphire substrate; solar-blind UV photodetector; wide bandgap III-V nitride; Fires; Gallium nitride; III-V semiconductor materials; Infrared detectors; Missiles; Monitoring; Photoconducting devices; Photodetectors; Photonic band gap; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
  • Conference_Location
    Montreal, Que., Canada
  • Print_ISBN
    0-7803-3891-X
  • Type

    conf

  • DOI
    10.1109/LEOSST.1997.619243
  • Filename
    619243