Title :
X-ray K-edge shift in shocked aluminum
Author :
Perrot, F. ; Dharma-wardana, M.W.C.
Author_Institution :
Centre d´´Etudes de Limeil-Valenton, Villeneuve-St-Georges, France
Abstract :
Summary form only given. Measurements of the K-edge frequency shift in shocked-aluminum are interpreted. The calculated frequency contains all the relaxation effects and electron-ion interactions. At higher temperatures, the lowest transition frequencies occur when the electron is trapped in holes below the Fermi level.
Keywords :
aluminium; Fermi level; K-edge frequency shift; X-ray K-edge shift; electron-ion interactions; lowest transition frequencies; relaxation effects; shocked Al; Aluminum; Charge carrier processes; Councils; Distribution functions; Electrons; Frequency measurement; Impurities; Plasma density; Plasma temperature; Solids;
Conference_Titel :
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location :
Vancouver, BC, Canada
Print_ISBN :
0-7803-1360-7
DOI :
10.1109/PLASMA.1993.593601
