DocumentCode
1964114
Title
X-ray K-edge shift in shocked aluminum
Author
Perrot, F. ; Dharma-wardana, M.W.C.
Author_Institution
Centre d´´Etudes de Limeil-Valenton, Villeneuve-St-Georges, France
fYear
1993
fDate
7-9 June 1993
Firstpage
221
Abstract
Summary form only given. Measurements of the K-edge frequency shift in shocked-aluminum are interpreted. The calculated frequency contains all the relaxation effects and electron-ion interactions. At higher temperatures, the lowest transition frequencies occur when the electron is trapped in holes below the Fermi level.
Keywords
aluminium; Fermi level; K-edge frequency shift; X-ray K-edge shift; electron-ion interactions; lowest transition frequencies; relaxation effects; shocked Al; Aluminum; Charge carrier processes; Councils; Distribution functions; Electrons; Frequency measurement; Impurities; Plasma density; Plasma temperature; Solids;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location
Vancouver, BC, Canada
ISSN
0730-9244
Print_ISBN
0-7803-1360-7
Type
conf
DOI
10.1109/PLASMA.1993.593601
Filename
593601
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