DocumentCode
1964428
Title
Pairwise Markov random fields and its application in textured images segmentation
Author
Pieczynski, Wojciech ; Tebbache, Abdel-Nasser
Author_Institution
Dept. of Signal et Image, Inst. Nat. des Telecommun., Evry, France
fYear
2000
fDate
2000
Firstpage
106
Lastpage
110
Abstract
The use of random fields, which allows one to take into account the spatial interaction among random variables in complex systems, is a frequent tool in numerous problems of statistical image processing, like segmentation or edge detection. In statistical image segmentation, the model is generally defined by the probability distribution of the class field, which is assumed to be a Markov field, and the probability distributions of the observations field conditional to the class field. In such models the segmentation of textured images is difficult to perform and one has to resort to some model approximations. The originality of our contribution is to consider the Markovianity of the pair (class field observations field). We obtain a different model; in particular, the class field is not necessarily a Markov field. The model proposed makes possible the use of Bayesian methods like MPM or MAP to segment textured images with no model approximations. In addition, the textured images can be corrupted with correlated noise. Some first simulations to validate the model proposed are also presented
Keywords
Bayes methods; Markov processes; image segmentation; image texture; Bayesian methods; MAP; MPM; Markov random fields; class field; complex systems; correlated noise; edge detection; observations field; probability distribution; simulations; spatial interaction; statistical image processing; textured image segmentation; Bayesian methods; Gaussian noise; Hidden Markov models; Image edge detection; Image processing; Image segmentation; Markov random fields; Probability distribution; Random variables; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Analysis and Interpretation, 2000. Proceedings. 4th IEEE Southwest Symposium
Conference_Location
Austin, TX
Print_ISBN
0-7695-0595-3
Type
conf
DOI
10.1109/IAI.2000.839581
Filename
839581
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