• DocumentCode
    1964731
  • Title

    Double-balanced 130–180 GHz passive and balanced 145–165 GHz active mixers in 45 nm CMOS

  • Author

    Inac, Ozgur ; Fung, Andy ; Rebeiz, Gabriel M.

  • Author_Institution
    Univ. of California, San Diego, La Jolla, CA, USA
  • fYear
    2011
  • fDate
    19-21 Sept. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents wideband passive and active mixers in the 100-200 GHz range. The mixers are built using a 45nm CMOS SOI process with an ft of 220 GHz when referenced to the top metal layer. The passive double-balanced mixer results in a conversion loss of 12-13 dB from 130-180 GHz (including balun, transmission line and GSG pad losses) and achieves optimal performance with 3 dBm of LO power (referenced to the GSG LO pads). The active mixer achieves a conversion loss of 4.5 dB with a 3-dB bandwidth of 145-165 GHz, and consumes only 10 mW of DC power from a 1.5 V supply. The application areas are in wideband Gbps communications, imaging arrays with large IF bandwidths, and mm-wave spectrometers. To our knowledge, this work represents the first demonstration of high performance CMOS mixers in the 130-180 GHz frequency range.
  • Keywords
    CMOS integrated circuits; baluns; millimetre wave mixers; passive networks; silicon-on-insulator; CMOS; CMOS SOI process; GSG pad losses; balanced active mixers; balun; conversion loss; double-balanced passive mixers; frequency 100 GHz to 200 GHz; mm-wave spectrometry; power 10 mW; size 45 nm; top metal layer; transmission line; voltage 1.5 V; CMOS integrated circuits; Gain; Loss measurement; Mixers; Radio frequency; Transistors; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2011 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4577-0222-8
  • Type

    conf

  • DOI
    10.1109/CICC.2011.6055323
  • Filename
    6055323