DocumentCode :
1964901
Title :
Power gating implementation for noise mitigation with body-tied triple-well structure
Author :
Takai, Yasumichi ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
fYear :
2011
fDate :
19-21 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper investigates power gating implementations that mitigate power supply noise. We focus on the body connection of power-gated circuits, and examine the amount of power supply noise induced by power-on rush current and the contribution of a power-gated circuit as a decoupling capacitance during the sleep mode. To figure out the best implementation, we designed and fabricated a test chip in 65nm process. Experimental results with measurement and simulation reveal that the power-gated circuit with body-tied structure in triple-well is the best implementation from the following three points; power supply noise due to rush current, the contribution of decoupling capacitance during the sleep mode and the leakage reduction thanks to power gating.
Keywords :
circuit noise; power supply circuits; body-tied triple-well structure; decoupling capacitance; leakage reduction; power gating implementation; power supply noise mitigation; power-gated circuit; power-on rush current; size 65 nm; sleep mode; Capacitance; Current measurement; Logic gates; Noise; Noise measurement; Power measurement; Power supplies; on-chip power supply noise; power gating; rush current; well structure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2011 IEEE
Conference_Location :
San Jose, CA
ISSN :
0886-5930
Print_ISBN :
978-1-4577-0222-8
Type :
conf
DOI :
10.1109/CICC.2011.6055332
Filename :
6055332
Link To Document :
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