Title :
The Use of Time Domain Techniques for Microwave Transistor s-Parameter Measurements
Author :
Loeb, H.W. ; Davies, C. ; Ward, P.
Author_Institution :
The Cranfield Institute of Technology, CRANFIELD, BEDFORD, U.K.
Abstract :
The determination of microwave transistor s-parameter over a frequency band up to ¿ lOGHz by means of Time Domain Techniques, involving Fourier analysis and deconvolution of transient response data, is described and compared with network analyzer techniques. A method for the extraction of active device parameters from measurements on packaged devices is presented.
Keywords :
Deconvolution; Frequency; Microwave devices; Microwave measurements; Microwave theory and techniques; Microwave transistors; Scattering parameters; Time domain analysis; Time measurement; Transient response;
Conference_Titel :
Microwave Conference, 1975. 5th European
Conference_Location :
Hamburg, Germany
DOI :
10.1109/EUMA.1975.332156
