DocumentCode
1965161
Title
Digital clock and data recovery circuit design: Challenges and tradeoffs
Author
Talegaonkar, Mrunmay ; Inti, Rajesh ; Hanumolu, Pavan Kumar
Author_Institution
Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
fYear
2011
fDate
19-21 Sept. 2011
Firstpage
1
Lastpage
8
Abstract
Digital clock and recovery circuits (CDRs) have recently emerged as an alternative to their more classical analog counterparts. This paper seeks to elucidate the design challenges and trade-offs involved in the design of digital CDRs. The jitter performance metrics such as jitter generation, jitter transfer, and jitter tolerance are related to digital CDR parameters and design guidelines are provided. The impact of digital phase detector non-linearity and quantization error, the digitally-controlled oscillator frequency quantization error, and loop latency on a digital CDR performance is analyzed and demonstrated using accurate behavioral simulations.
Keywords
clock and data recovery circuits; jitter; network synthesis; oscillators; phase detectors; digital CDR design; digital CDR parameters; digital clock and data recovery circuit design; digital phase detector nonlinearity; digitally-controlled oscillator frequency quantization error; jitter generation; jitter performance metrics; jitter tolerance; jitter transfer; quantization error; Bandwidth; Detectors; Jitter; Quantization; Transfer functions; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2011 IEEE
Conference_Location
San Jose, CA
ISSN
0886-5930
Print_ISBN
978-1-4577-0222-8
Type
conf
DOI
10.1109/CICC.2011.6055346
Filename
6055346
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