• DocumentCode
    1965161
  • Title

    Digital clock and data recovery circuit design: Challenges and tradeoffs

  • Author

    Talegaonkar, Mrunmay ; Inti, Rajesh ; Hanumolu, Pavan Kumar

  • Author_Institution
    Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
  • fYear
    2011
  • fDate
    19-21 Sept. 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Digital clock and recovery circuits (CDRs) have recently emerged as an alternative to their more classical analog counterparts. This paper seeks to elucidate the design challenges and trade-offs involved in the design of digital CDRs. The jitter performance metrics such as jitter generation, jitter transfer, and jitter tolerance are related to digital CDR parameters and design guidelines are provided. The impact of digital phase detector non-linearity and quantization error, the digitally-controlled oscillator frequency quantization error, and loop latency on a digital CDR performance is analyzed and demonstrated using accurate behavioral simulations.
  • Keywords
    clock and data recovery circuits; jitter; network synthesis; oscillators; phase detectors; digital CDR design; digital CDR parameters; digital clock and data recovery circuit design; digital phase detector nonlinearity; digitally-controlled oscillator frequency quantization error; jitter generation; jitter performance metrics; jitter tolerance; jitter transfer; quantization error; Bandwidth; Detectors; Jitter; Quantization; Transfer functions; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2011 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4577-0222-8
  • Type

    conf

  • DOI
    10.1109/CICC.2011.6055346
  • Filename
    6055346