• DocumentCode
    1965194
  • Title

    The Discrimination of Metallic Coins Using a Scan Type Magnetic Camera

  • Author

    Jun, Jongwoo ; Lee, Jinyi ; Lee, Jaesun

  • Author_Institution
    Res. Centre for Real Time NDT, Chosun Univ., Gwangju, South Korea
  • fYear
    2010
  • fDate
    13-15 Jan. 2010
  • Firstpage
    355
  • Lastpage
    359
  • Abstract
    Coins from different countries having similar sizes and weights could be used in a crime because they may have a large difference in economic value. An algorithm, which can be used to discriminate these coins, employs a scanning magnetic camera, which uses a linearly integrated 64 InSb Hall sensor array (LIHaS) on a NiZn ferrite wafer and a complex induced current-magnetic flux leakage method (CIC-MFL). The coins consist of paramagnetic metals or magnetically combined metals. The distribution of the magnetic field around each coin was measured at a lift-off of 1 mm, and processed by using the ¿VRMS/¿x term. It is possible to apply the peak-distances and the integrated absolute minimum values of ¿VRMS/¿x in order to discriminate the coins. 170 cases that used 85 coins of 43 different denominations from 10 countries were examined to verify the proposed algorithm. The discrimination probability was 90.7%.
  • Keywords
    Hall effect devices; III-V semiconductors; cameras; electromagnetic devices; electromagnets; image recognition; image scanners; indium compounds; magnetic devices; magnetic sensors; nickel alloys; paramagnetic materials; zinc alloys; InSb; NiZn; ferrite wafer; induced current magnetic flux leakage method; linearly integrated Hall sensor array; magnetic field; magnetically combined metal; metallic coins discrimination; paramagnetic metals; scan type magnetic camera; scanning magnetic camera; Cameras; Electromagnets; Gold; Magnetic flux leakage; Magnetic materials; Magnetic sensors; Magnetic separation; Paramagnetic materials; Sensor arrays; Size control; Hall sensor array; discrimination of metallic coin; induced current; magnetic flux leakage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
  • Conference_Location
    Ho Chi Minh City
  • Print_ISBN
    978-0-7695-3978-2
  • Electronic_ISBN
    978-1-4244-6026-7
  • Type

    conf

  • DOI
    10.1109/DELTA.2010.19
  • Filename
    5438663