DocumentCode
1965477
Title
An 8b 80MSample/s pipelined ADC with background calibration
Author
Jun Ming ; Lewis, S.H.
Author_Institution
California Univ., Davis, CA, USA
fYear
2000
fDate
9-9 Feb. 2000
Firstpage
42
Lastpage
43
Abstract
Conventional pipelined ADCs with redundancy and digital correction have linearity limited by the gain accuracy of the interstage amplifiers or the linearity of the D/A subconversions. With a fully differential 1.5 b/stage architecture, the D/A subconverters can in principle be inherently linear, and the main limitation stems from the interstage gain accuracy. Besides the error caused by finite-op-amp gain and capacitor mismatch, the linear portion of the incomplete op-amp settling can also be modeled as an interstage gain error. One way to compensate for interstage gain errors is to adjust the reference voltage from each stage to the next so that the ratio of the reference in one stage to the corresponding value in the previous stage is equal to 1+/spl epsi/, where /spl epsi/ is the gain error between the stages. This pipelined ADC uses monolithic calibration to adjust the reference voltages of the first two stages in the background during normal ADC operation to compensate for gain errors in the first two interstage amplifiers. Calibration is potentially useful even at an 8b level because it allows the use of small capacitors and low op-amp gain, reducing power dissipation and the minimum required supply voltage and increasing the maximum speed in a given technology. The key contributions here are the use of background calibration to improve the linearity of a pipelined ADC and the implementation of these techniques with the ADC on one CMOS IC.
Keywords
CMOS integrated circuits; analogue-digital conversion; calibration; low-power electronics; pipeline processing; 8 bit; CMOS; background calibration; gain errors; linearity; monolithic calibration; pipelined ADC; power dissipation; reference voltage; CMOS integrated circuits; CMOS process; CMOS technology; Calibration; Capacitors; Linearity; Operational amplifiers; Power dissipation; Redundancy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-5853-8
Type
conf
DOI
10.1109/ISSCC.2000.839683
Filename
839683
Link To Document