Complex Index of Refraction Measurements with a Sweep Generator Interferometer

A simple and precise method of complex refractive index meaurements in the submillimeter range has been elaborated. As a source of radiation in the quasioptical interferometer we use a swept carcinotron. The method combines the advantages of usual Fourier transform spectrometry and interferometers with coherent sources of radiation: there is no uncertainty in the order of interferometric maximum or minimum, the error connected with multi-reflection in the sample and in the space between generator and receiver is almost completely eliminated. The complex refractive indexes of some polymers, ferrites and amsotropic crystals were measured. A high dichroism in crystals of TGS and TGSe was observed.