DocumentCode :
1965611
Title :
Current profiling and transverse mode control in broad area lasers
Author :
Huyet, G. ; Houlihan, J. ; O´Callaghan, J.R. ; Voignier, V. ; Corbett, Brandon ; McInerney, J.G.
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
659
Abstract :
High power, high brightness semiconductor lasers are required for applications such as pump sources for fiber amplifiers. The increase of the stripe width of lasers constitutes a method to overcome the limitation of narrow stripe lasers. However broad area semiconductor lasers have poor coherence properties due to the appearance of filamentation and higher order transverse modes. Here, we analyse the coherence properties of high power semiconductor lasers with a modified transverse current profile. Our experimental investigations are based on conventional stripe geometry high power edge emitting devices incorporating an extra p type spreading layer to smooth the carriers from the usual top hat injection profile. We also use a lithographic half tone technique to achieve the desired injection profile. Current profiling could also be implemented in vertical cavity lasers with proton implementation or inhomogeneous optical pumping
Keywords :
laser modes; light coherence; optical focusing; semiconductor lasers; thermal blooming; CW regime; beam propagation; broad area lasers; coherence properties; current profiling; edge emitting devices; far fields; filamentation; focusing thermal lens; high brightness semiconductor lasers; high power lasers; inhomogeneous optical pumping; modified transverse current profile; near fields; off axis emission; single transverse mode; space-time resolved numerical simulations; spatial coherence; stripe width; transverse mode control; transverse travelling waves; Brightness; Coherence; Fiber lasers; Laser excitation; Laser modes; Optical control; Optical fiber amplifiers; Power lasers; Pump lasers; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society, 2001. LEOS 2001. The 14th Annual Meeting of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1092-8081
Print_ISBN :
0-7803-7105-4
Type :
conf
DOI :
10.1109/LEOS.2001.968986
Filename :
968986
Link To Document :
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