DocumentCode
1965697
Title
A 0.66e−rms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique
Author
Shang-Fu Yeh ; Kuo-Yu Chou ; Hon-Yih Tu ; Chao, Calvin Yi-Ping ; Fu-Lung Hsueh
Author_Institution
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
fYear
2015
fDate
17-19 June 2015
Abstract
A conditional correlated multiple sampling (CCMS) technique for low noise CMOS image sensor (CIS) is proposed to reduce noise and address low frame rate issue caused by the conventional correlated multiple sampling (CMS) technique. An 8Mpixel 3D-stacked CIS with 1.1um pixel pitch is designed and verified. Measurement results show this technique can achieve 0.66e-rms at 36.1 kHz A/D sampling rate per pixel with analog gain at 16 and 5-times multiple sampling. The resulting DNL is within -0.49/+0.45LSB.
Keywords
CMOS image sensors; readout electronics; analog gain; conditional correlated multiple sampling technique; low frame rate issue; temporal-readout-noise 3D-stacked CMOS image sensor; CMOS image sensors; Gain measurement; Indexes; Latches; Noise; Photonics; Radiation detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits (VLSI Circuits), 2015 Symposium on
Conference_Location
Kyoto
Print_ISBN
978-4-86348-502-0
Type
conf
DOI
10.1109/VLSIC.2015.7231332
Filename
7231332
Link To Document