DocumentCode
1965754
Title
An Exact and Efficient Critical Path Tracing Algorithm
Author
Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Bernardi, P. ; Reorda, M. Sonza
Author_Institution
Lab. d´´Inf., de Robot. et de Microelectron. de Montpellier, Univ. Montpellier II, Montpellier, France
fYear
2010
fDate
13-15 Jan. 2010
Firstpage
164
Lastpage
169
Abstract
This paper presents an exact and efficient Critical Path Tracing algorithm targeting fault simulation of both Transition and Stuck-at faults. The complexity of the proposed algorithm is linear in the number of gates traced during the path tracing process. Experimental results show the efficiency of the proposed approach on a set of benchmark circuits.
Keywords
fault simulation; logic testing; efficient critical path tracing algorithm; fault simulation; stuck-at faults; transition faults; Algebra; Algorithm design and analysis; Circuit faults; Circuit simulation; Electronic equipment testing; Fault detection; Libraries; Logic functions; Logic gates; Robots; Critical Path Tracing; Fault Simulation; Fault models;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location
Ho Chi Minh City
Print_ISBN
978-0-7695-3978-2
Electronic_ISBN
978-1-4244-6026-7
Type
conf
DOI
10.1109/DELTA.2010.35
Filename
5438696
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