• DocumentCode
    1965768
  • Title

    Modeling of FET Switches

  • Author

    Kharabi, Faramarz

  • Author_Institution
    RFMD, Greensboro, NC, USA
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper describes the salient features of modeling FET devices for switch applications, with examples in GaAs PHEMT and GaN HEMT technologies. It explains the subtle differences that differentiate these models from PA models and what is required to accurately describe their small- and large- signal behavior. In that respect, suggestions are made on how to approach formulation of critical parameters in meeting unique requirements of modeling high-power switches with novel device structures.
  • Keywords
    III-V semiconductors; field effect transistor switches; gallium arsenide; high electron mobility transistors; wide band gap semiconductors; FET devices modeling; GaAs; GaN; PA models; PHEMT technologies; device structures; high-power switches modeling; large-signal behavior; small-signal behavior; Gallium nitride; Logic gates; Mathematical model; PHEMTs; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE
  • Conference_Location
    La Jolla, CA
  • ISSN
    1550-8781
  • Print_ISBN
    978-1-4673-0928-8
  • Type

    conf

  • DOI
    10.1109/CSICS.2012.6340092
  • Filename
    6340092