Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

Author

Roche, Philippe ; Gasiot, Gilles ; Autran, J.L. ; Munteanu, Daniela ; Reed, R.A. ; Weller, Robert A.

Author_Institution

STMicroelectron., Crolles, France

Volume

61

Issue

3

fYear

2014

fDate

Jun-14

Firstpage

1498

Lastpage

1500

Abstract

Recently (IEEE Trans. Nucl. Sci., Vol. 60, No. 3, pp. 1876-1911, 2013), Reed published an anthology of contributions from different research groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The Tool suIte for rAdiation Reliability Assessment (TIARA) simulation platform and its development by STMicroelectronics and Aix-Marseille University is described in this paper as a complement to this anthology.

Keywords

Monte Carlo methods; high energy physics instrumentation computing; radiative transfer; semiconductor counters; Aix-Marseille University; Monte Carlo-based radiation transport tools; STMicroelectronics; TIARA radiation transport tool; Tool suIte for radiation reliability assessment; semiconductor material; single particle event effects simulation; Atmospheric measurements; Atmospheric modeling; Integrated circuit modeling; Monte Carlo methods; Neutrons; Object oriented modeling; Solid modeling; Monte Carlo radiation transport; single event effects;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2014.2318778

Filename

6820762