• DocumentCode
    1965812
  • Title

    PHEMT-Based Ultrawideband Low Noise Amplifier with Room-Cryogenic Temperature Operability

  • Author

    Vemuri, Hari ; Velicu, Silviu ; Gilmore, Angelo Scotty ; Grein, Christoph ; Mattamana, Aji ; Quach, Tony ; Orlando, Pompeii ; Campbell, Charles

  • Author_Institution
    EPIR Technol., Inc., Bolingbrook, IL, USA
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An ultra wideband MMIC low noise amplifier (LNA) based on the 0.15-μm pHEMT 3MI Triquint power process has been demonstrated. A feedforward noise cancellation technique was employed to reduce the thermal noise in the LNA. The LNA has a surface area of 2 mm by 2 mm. The gain of LNA is 15 dB between 400 MHz and 12.5 GHz with ±0.3dB gain flatness across the band. The return loss at both input and output is better than -10 dB. The measured noise figure at 300 K varied between 1.5 dB at 400 MHz and 2.6 dB at 12 GHz, and the MMIC´s DC power consumption is less than 200 mW. The LNA was further characterized at cryogenic temperatures in terms of gain, input/output return loss and noise figure. The noise figure measured at 100 K dropped to 1.1 dB at 12 GHz. The gain improved at cryogenic temperatures, the overall variation in the gain between 300 K and 100 K is less than 2 dB while the input and output return losses did not change significantly. This wideband LNA can be used in applications requiring low noise and/or low temperatures.
  • Keywords
    MMIC amplifiers; high electron mobility transistors; low noise amplifiers; microwave transistors; MMIC DC power consumption; PHEMT-based ultrawideband low noise amplifier; feedforward noise cancellation technique; frequency 400 MHz to 12.5 GHz; gain -0.3 dB; gain 0.3 dB; noise figure 1.1 dB; noise figure 1.5 dB to 2.6 dB; pHEMT 3MI triquint power process; room-cryogenic temperature operability; size 0.15 mum; temperature 300 K to 100 K; thermal noise; ultrawideband MMIC LNA; ultrawideband MMIC low noise amplifier; Cryogenics; Gain; HEMTs; Noise; Noise figure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE
  • Conference_Location
    La Jolla, CA
  • ISSN
    1550-8781
  • Print_ISBN
    978-1-4673-0928-8
  • Type

    conf

  • DOI
    10.1109/CSICS.2012.6340095
  • Filename
    6340095