Title :
A CMOS image sensor with a simple FPN-reduction technology and a hole accumulated diode
Author :
Yonemoto, K. ; Sumi, H. ; Suzuki, R. ; Ueno, T.
Author_Institution :
Camera Syst. Dept., Sony Corp., Kanagawa, Japan
Abstract :
CMOS image sensors are generally characterized by their low power consumption, single power supply and capability for on-chip system integration in contrast with CCD image sensors. Even though CMOS image sensors have these advantages, they are not yet widely used in image capture applications because of their insufficient image quality due to the difficulty in FPN cancellation. This FPN-reduction technology and a hole accumulated diode (HAD) for sensing elements is applied to the CMOS image sensor. The CMOS image sensor consists of a 640/spl times/480 pixel array in 1/3 inch image format, a current-to-voltage converter, a correlated double sampling circuit and a timing generator. This image sensor uses a 0.35 /spl mu/m CMOS logic process with specialized add-on steps for HAD. The power supply is 3.3 V and maximum frame rate is 30 frames/s.
Keywords :
CMOS image sensors; integrated circuit noise; semiconductor diodes; timing; 0.333 in; 0.35 micron; 3.3 V; CMOS image sensor; FPN cancellation; FPN-reduction technology; correlated double sampling circuit; current-to-voltage converter; hole accumulated diode; image quality; low power consumption; onchip system integration; single power supply; timing generator; CMOS image sensors; CMOS technology; Charge-coupled image sensors; Diodes; Energy consumption; Image quality; Pixel; Power supplies; Sensor arrays; System-on-a-chip;
Conference_Titel :
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5853-8
DOI :
10.1109/ISSCC.2000.839709