Title :
A true single SoC for UHF mobile RFID reader
Author :
Kim, Jongmoon ; Yun, Seokoh ; Oh, Wonkab ; Kil, Minsu ; Cho, Sanghyun
Author_Institution :
PHYCHIPS Inc., Daejeon, South Korea
Abstract :
A true single SoC for UHF Mobile RFID Reader has been implemented in a 0.18μm embedded flash CMOS technology. The SoC includes 900MHz RF transceiver, PA, MODEM, MCU, memory and peripherals with fully compliant ISO/IEC 18000-6C and EPC Global Class1 Gen2 reader protocol. The receiver 1% PER sensitivity is -88dBm at RF input port. The class-A PA is integrated in the transmitter, with 20dBm CW carrier output power. The fully integrated fractional-N frequency synthesizer with a 3.6GHz LC VCO is implemented for low wide band phase noise. The LO phase noise is -104.7dBc/Hz at 100KHz offset frequency and -130.6dBc/Hz at 1MHz offset frequency. The SoC sufficiently satisfies a multiple-interrogator environment´s adjacent channel power ratio requirement of the ISO/IEC 18000-6C standard. In operating Tag read mode, the SoC dissipates 980mW when transmitting a 20dBm CW carrier signal. The die area of the SoC is 17.1mm2, of which 7.6mm2 is used by the 900MHz RF transceiver and PA.
Keywords :
CMOS digital integrated circuits; UHF integrated circuits; frequency synthesizers; microwave integrated circuits; microwave oscillators; mobile radio; phase noise; radiofrequency identification; system-on-chip; voltage-controlled oscillators; CW carrier output power; CW carrier signal; EPC Global Classl Gen2 reader protocol; ISO-IEC 18000-6C standard; LC VCO; LO phase noise; MCU; MODEM; RF transceiver; UHF mobile RFID reader; adjacent channel power ratio requirement; class-A PA; embedded flash CMOS technology; frequency 3.6 GHz; frequency 900 MHz; fully integrated fractional-N frequency synthesizer; low wide band phase noise; size 0.18 mum; tag read mode; true single SoC; IEC standards; Mobile communication; Radio frequency; Radiofrequency identification; Receivers; System-on-a-chip; Transceivers;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2011 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4577-0222-8
DOI :
10.1109/CICC.2011.6055391