• DocumentCode
    1966182
  • Title

    A new frequency-dependent-model for cables

  • Author

    Valdez, C. Rodriguez ; Tallam, R.M. ; Kerkman, R.J.

  • Author_Institution
    Electr. Eng. Dept., Purdue Univ., West Lafayette, IN
  • fYear
    2008
  • fDate
    18-20 May 2008
  • Firstpage
    151
  • Lastpage
    158
  • Abstract
    This paper deals with the inclusion of frequency effects (skin effect) in an enhanced transport delay model for electric cables of arbitrary length connected to a PWM-IGBT variable frequency drive (VFD), to better predict overvoltage peaks in the line during transient.The problem and the importance of predicting peak overvoltages to determine the appropriate insulation to be used by cables is addressed. Frequency-domain characterization of cables is considered. A function in the Laplace-s-domain is fitted to such characterized behavior by using genetic algorithms. From the step response of the cable, and using genetic algorithms (GA), an impulse function (propagation function) is derived. Such a function is used to predict frequency-dependent voltage and current in longer cables. Simulation and experimental results are provided.
  • Keywords
    Laplace transforms; cables (electric); electric drives; frequency-domain analysis; genetic algorithms; insulated gate bipolar transistors; pulse width modulation; Laplace-s-domain; PWM-IGBT variable frequency drive; electric cables; enhanced transport delay model; frequency effects; frequency-dependent voltage; frequency-dependent-cable model; frequency-domain characterization; genetic algorithms; impulse function; propagation function; Cable insulation; Conductors; Frequency dependence; Genetic algorithms; Power system transients; Predictive models; Proximity effect; Skin effect; Testing; Voltage control; Electric Cables; Genetic Algorithms (GA); Skin Effect; VFD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
  • Conference_Location
    Ames, IA
  • Print_ISBN
    978-1-4244-2029-2
  • Electronic_ISBN
    978-1-4244-2030-8
  • Type

    conf

  • DOI
    10.1109/EIT.2008.4554285
  • Filename
    4554285