Title :
Enabling False Path Identification from RTL for Reducing Design and Test Futileness
Author :
Iwata, Hiroshi ; Ohtake, Satoshi ; Fujiwara, Hideo
Author_Institution :
Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
Abstract :
Information on false paths is useful for design and test. Since identification of false paths at gate level is hard, several methods using high-level design information have been proposed. These methods are effective only if the correspondence between paths at register transfer level (RTL) and at gate level can be established. Until now, the correspondence has been established only by some restricted logic synthesis. In this paper, we propose a method for mapping RTL false paths to their corresponding gate level paths without such a specific logic synthesis.
Keywords :
logic design; logic gates; logic testing; network synthesis; RTL; design futileness; false path identification; functional equivalence; high level testing; logic synthesis; path mapping; register transfer level; test futileness; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Computer simulation; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis; false path; functional equivalence; high level testing; path mapping;
Conference_Titel :
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location :
Ho Chi Minh City
Print_ISBN :
978-0-7695-3978-2
Electronic_ISBN :
978-1-4244-6026-7
DOI :
10.1109/DELTA.2010.23