• DocumentCode
    1966191
  • Title

    Enabling False Path Identification from RTL for Reducing Design and Test Futileness

  • Author

    Iwata, Hiroshi ; Ohtake, Satoshi ; Fujiwara, Hideo

  • Author_Institution
    Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
  • fYear
    2010
  • fDate
    13-15 Jan. 2010
  • Firstpage
    20
  • Lastpage
    25
  • Abstract
    Information on false paths is useful for design and test. Since identification of false paths at gate level is hard, several methods using high-level design information have been proposed. These methods are effective only if the correspondence between paths at register transfer level (RTL) and at gate level can be established. Until now, the correspondence has been established only by some restricted logic synthesis. In this paper, we propose a method for mapping RTL false paths to their corresponding gate level paths without such a specific logic synthesis.
  • Keywords
    logic design; logic gates; logic testing; network synthesis; RTL; design futileness; false path identification; functional equivalence; high level testing; logic synthesis; path mapping; register transfer level; test futileness; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Computer simulation; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis; false path; functional equivalence; high level testing; path mapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
  • Conference_Location
    Ho Chi Minh City
  • Print_ISBN
    978-0-7695-3978-2
  • Electronic_ISBN
    978-1-4244-6026-7
  • Type

    conf

  • DOI
    10.1109/DELTA.2010.23
  • Filename
    5438718