DocumentCode
1966191
Title
Enabling False Path Identification from RTL for Reducing Design and Test Futileness
Author
Iwata, Hiroshi ; Ohtake, Satoshi ; Fujiwara, Hideo
Author_Institution
Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
fYear
2010
fDate
13-15 Jan. 2010
Firstpage
20
Lastpage
25
Abstract
Information on false paths is useful for design and test. Since identification of false paths at gate level is hard, several methods using high-level design information have been proposed. These methods are effective only if the correspondence between paths at register transfer level (RTL) and at gate level can be established. Until now, the correspondence has been established only by some restricted logic synthesis. In this paper, we propose a method for mapping RTL false paths to their corresponding gate level paths without such a specific logic synthesis.
Keywords
logic design; logic gates; logic testing; network synthesis; RTL; design futileness; false path identification; functional equivalence; high level testing; logic synthesis; path mapping; register transfer level; test futileness; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Computer simulation; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis; false path; functional equivalence; high level testing; path mapping;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location
Ho Chi Minh City
Print_ISBN
978-0-7695-3978-2
Electronic_ISBN
978-1-4244-6026-7
Type
conf
DOI
10.1109/DELTA.2010.23
Filename
5438718
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